Anasys Instruments is dedicated to delivering innovative products and solutions that measure nanoscale material properties. Understanding structure-property correlation, especially for samples with spatially varying physical and chemical properties, is critical in a diverse range of fields, including polymers, materials science, life science, semiconductors, and data storage, to name but a few. Anasys Instruments introduced nanothermal analysis (nano-TA™) based on self-heating ThermaLever™ AFM cantilever probes in 2006, allowing nanoscale measurements of thermal properties. In 2010, Anasys Instruments proudly introduced breakthrough nanoIR™ technology. This AFM-based solution enables chemical characterization utilizing infrared spectroscopy techniques at the nanoscale. By combining AFM and infrared spectroscopy, Anasys Instruments offers researchers an unprecedented suite of chemical, mechanical, and thermal property measurement capabilities.
nanoIR2 - True, model free nanoscale IR absorption spectroscopy
- Expands nanoscale IR to a broad range of real world samples
- New resonance enhanced mode enables nanoscale IR on <20nm films
- Rich, interpretable IR spectra
- Designed and built for productivity and rapid time-to-results
- Multifunctional measurements including integrated
thermal and mechanical property mapping
- Powerful, full featured AFM
For further detail visit: http://www.anasysinstruments.com/products/nanoir2/
nanoIR2-s : Setting a new standard for nanoscale IR spectroscopy and imaging
- One Platform for the highest IR spectral and spatial resolution
- Two complementary nanoscale IR techniques: s-SNOM; and AFM-IR
- Multiple nanoscale property mapping modes with full featured AFM
- “Anasys Engineered” for productivity and reliability
The only nanoscale IR spectroscopy and imaging platform with both
For further detail visit: http://www.anasysinstruments.com/products/nanoir2-s/
The nanoIR platform combines a tunable IR source with an AFM measurement module to allow topographic integrated topographic and spectroscopic measurements. An integrated video microscope allows users to quickly find features of interest on samples mounted on a zinc selenide prism. The AFM measurement head enables high resolution topographic measurements along with detection of IR absorption from regions of the sample. The AFM measurement head rotates back for easy sample access. The sample can be easily exchanged without tools in less than a minute.
With the nanoIR system, multifunctional measurements enable you to get a more complete picture of your sample, integrating topographic, spectroscopic, mechanical and thermal property mapping. High resolution topographic measurements are performed by AFM, while the photothermal induced resonance (PTIR) technique adds local chemical characterization with infrared spectroscopy. The PTIR technique also supports contact resonance frequency measurements that allows simultaneous map characterize materials in a variet.
|Subcellular IR Imaging of a Metal–Carbonyl Moiety Using Photothermally Induced Resonance
Clotilde Policar, Jenny Birgitta Waern, Marie-Aude Plamont, Sylvain Clède, Céline Mayet, Rui Prazeres, Jean-Michel Ortega, Anne Vessières and Alexandre Dazzi
Angewandte Chemie Int. Ed. 50(2011)860-864 English
Angewandte Chemie 123 (2011)890-894 German
Some like it hot! The photothermally induced resonance technique, in which an AFM microscope is coupled to a tunable pulsed IR laser, allows IR mapping and gives access to local IR spectra at the subcellular level. A metal–carbonyl compound was internalized in cells and detected in the cell nucleus thanks to its IR signature. The local IR spectrum at the nucleus showed the characteristic IR bands of the Re(CO)3 unit.
- Image the sample of interest with sub-30nm spatial resolution (in contact or intermittent contact modes) and identify the regions whose thermal properties that you’d like to study.
- Heat a local area of less than 100nm diameter with the probe to temperatures of over 500 C to study thermal properties such as glass transition or melting point.
- Local heating allows very fast heating rates up to 600,000Ëš C/min and eliminates thermal drift issues that plague bulk sample heating approaches.
- Image with a heated tip to induce local thermal events over specific regions of a surface.
- Map the temperatures across the sample with a resolution of <0.1 ºC
Please click here for a Data Sheet
The VESTA is the world’s first “point and click” instrument for localized thermal analysis and Transition Temperature Microscopy . This R&D100 Award winning technology uses a nanoscale thermal probe to locally heat samples to measure and map thermal transition temperatures and other thermal properties. Transition Temperature Microscopy gives critical information on samples from the scale of millimeters to nanometers and provides information that is not obtainable by any other technique. Easy to learn and operate, the VESTA allows you to move beyond bulk thermal anaysis to see the critical information you’ve been missing.
Click here to learn more on the Applications of the VESTA and Transition Temperature Microscopy (TTM)
Localized Thermal Analysis (LTA)
The sample is heated locally with a thermal probe and the localized thermal transition temperature is measured via thermo mechanical analysis (TMA). This is shown below in Fig 1 where the plot shown is the physical deflection of the thermal probe versus its temperature.
Point and Click Operation
VESTA is easy to use. Locate a region of interest on the video microscope image and then click to Insert picture from Brochure start a local thermal analysis. Measurement data appears in seconds. You can even program an array of points for automatic and unattended operation.
Transition Temperature Microscopy (TTM)A TTM Image is obtained by plotting the localized tansition temperatures at diferent points on the sample. You simply select the region on your optical microscope image on which you’d like a TTM image and the VESTA automatically proceeds to create the image. This powerful new form of microscopy enables you to identify localized thermal inhomogeneities on the sample surface that cannot be identifed by conventional forms of microscopy and bulk thermal analysis.
The ThermaLever™ probes are batch fabricated thermal probes composed of doped silicon. These probes have a heater integrated into the end of the cantilever which allows them to be heated in a controlled fashion to around 400Ëš C at very rapid heating rates. These characteristics distinguish them from previous commercially available thermal probes which typically either require some manual fabrication or can only be heated to low temperatures due to the resistor being fabricated from thin metal films. Another significant advance with these probes is the end radius of the tip. In previous styles of thermal probes the tip radius is significantly larger than standard AFM probes. This is not true with the ThermaLever probes which provide lateral resolution in imaging very similar to other AFM probes. Anasys Instruments has two models of ThermaLever probes available, the AN2-200 and AN2-300. Both these probe models have a tip height ranging from 3 to 6 microns and have a cantilever thickness of around 2 microns . The AN2-300 have lower spring constants and are designed for contact mode operation while the AN2-200 have high enough resonant frequencies to be used in intermittent contact mode. Shown below are SEM images of the AN probe, showing the entire cantilever (left) and a close-up of the tip (right).
Please click here for a Data Sheet