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Image Metrology

Image Metrology - Nanotechnology

Image Metrology was founded in 1998 and one of the leaders of image processing software for "nano-microscopy".


Particle & Pore Analysis, part 1 of 2 Particle & Pore Analysis, part 2 of 2

SPIP Image Metrology - Nano Micrscopy software

SPIP™ Software - The Scanning Probe Image Processor


Leading research institutes and high-tech companies in more than 42 countries including Australia use SPIP™ for image pro­cessing applications within semiconductor inspection, physics, material science, chemistry, biology, metrol­ogy, and nano technology.
SPIP™ supports a variety of microscope types and their file formats including Scanning Probe Micro­scopes (SPM), interference microscopes, Scanning Electron Microscopes (SEM), confocal microscopes, optical microscopes, and profilers. Whether you are an expert user or new to the field of image process­ing, SPIP™ lets you produce the results you need with just a few mouse clicks.
SPIP™ is a modular software package offered as a ba­sic module and 13 optional add-on modules. The Basic Module includes essential features such as file read­ing, profiling, and plane correction. The add-on mod­ules are dedicated to specific purposes within calibra­tion, noise reduction, analysis, and 3D visualization. On the following pages you will find a description of each module and learn how you can improve the ef­ficiency and quality of your work.

• Scanning Probe Microscopes (SPM)
• Scanning Electron Microscopes (SEM)
• Transmission Electron Microscopes (TEM)
• Interferometers
• Confocal Microscopes
• Profilers

Download your full working version today:
http://www.imagemet.com/index.php?main=download